David Ellis

Click for PDF version

Contact Information:

Education

Work Experience

Development Experience

Turing-Complete Languages

Turing-Incomplete Markup Languages

Databases

Major Libraries

Publications

  1. S. Malobabic, D. F. Ellis, J.A Salcedo, Y. Zhou, J.-J Hajjar, J.J. Liou, “Gate oxide evaluation under very fast transmission line pulse (VFTLP) CDM-type stress”, IEEE Int. Caribbean Conf. on Cir. Dev. and Sys., 2008
  2. D. F. Ellis, S. Malobabic, “Prediction of Gate Dielectric Breakdown in the CDM Timescale Utilizing Very Fast Transmission Line Pulsing”, International Reliability Physics Symposium (IRPS), April, 2009
  3. S. Malobabic, D. F. Ellis, J.A Salcedo, Y. Zhou; J.-J Hajjar, J.J. Liou, “Very Fast Transient Simulation and Measurement Methodology for ESD Technology Development”, International Reliability Physics Symposium (IRPS), April, 2009
  4. J. J. Liou, S. Malobabic, D. F Ellis, J. A. Salcedo, J.-J Hajjar, Y. Zhou “Transient Safe Operating Area (TSOA) Definition for ESD Applications (invited)”, EOS/ESD Symposium, September 2009.
  5. D. F. Ellis, Y. Zhou, J. A. Salcedo, J.-J. Hajjar, and J. J. Liou, “Prediction and Modeling of Thin Gate Oxide Breakdown under Arbitrary Voltage Waveforms,” IEEE Transactions on Electron Devices, vol. 57, no. 9, pp. 2296 – 2305, September 2010.
  6. Y. Zhou, J.-J. Hajjar, D. F. Ellis, A. Olney, and J. J. Liou, “A New Method to Evaluate Effectiveness of CDM ESD Protection,” EOS/ESD Symposium, October 2010.

IEEE Positions Held

IEEE Volunteer Work